ISocket IP16 4 in 1 Delamination Test Frame Motherboard Layered Test Racks Function Testing /16Plus/16Pro/16PM for iPhone 16

Description

Specification Name: XZZ iPhone 16 delamination test frame. Probe Type: Custom gold-plated spring probes. Product Size: 128X68X18mm. Package Size: 146X95X23mm. N.W: 189G. G.W: 249G. Support Model: iPhone 16/ 16Plus/16Pro/16 Pro Max. 1. XZZ iPhone 16 series layered test stand 4in1 is compatible with four models of iPhone 16/16Plus/16Pro/16 Pro Max. 2. The layered test stand has 6 features, using high-density metal, four-in-one, unobstructed, integrated, ergonomic design, and can be accurately positioned. 3. It solves the problem of repeated lamination and delamination during motherboard repair. The frame is equipped with imported pure copper gold-plated spring probes to enhance conductivity and stability, suitable for precise testing before installation. 4. The spring rebounds quickly, the feedback is timely, and the motherboard does not warp. The non-slip foot pad k can prevent sliding due to external forces and other problems during the test. 5. Use of high temperature resistant and corrosion-resistant new materials can not only reduce the return rate, but also improve the repair efficiency. 6. The functional board design is compatible with the test without the middle frame. Avoid the failure of the middle frame during the repair process.

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